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  4. Robust watermarking of point-sampled geometry
 
conference paper

Robust watermarking of point-sampled geometry

Cotting, Daniel
•
Weyrich, Tim
•
Pauly, Mark  
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2004
Proceedings - Shape Modeling International SMI 2004
Proceedings - Shape Modeling International SMI 2004

We present a new scheme for digital watermarking of point-sampled geometry based on spectral analysis. By extending existing algorithms designed for polygonal data to unstructured point clouds, our method is particularly suited for scanned models, where the watermark can be directly embedded in the raw data obtained from the 3D acquisition device. To handle large data sets efficiently, we apply a fast hierarchical clustering algorithm that partitions the model into a set of patches. Each patch is mapped into the space of eigenfunctions of an approximate Laplacian operator to obtain a decomposition of the patch surface into discrete frequency bands. The watermark is then embedded into the low frequency components to minimize visual artifacts in the model geometry. During extraction, the target model is resampled at optimal resolution using an MLS projection. After extracting a watermark from this model, the corresponding bit stream is analyzed using statistical methods based on correlation. We have applied our method to a number of point-sampled models of different geometric and topological complexity. These experiments show that our watermarking scheme is robust against numerous attacks, including low-pass filtering, resampling, affine transformations, cropping, additive random noise, and combinations of the above.

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Type
conference paper
DOI
10.1109/SMI.2004.1314510
Author(s)
Cotting, Daniel
Weyrich, Tim
Pauly, Mark  
Gross, Markus
Date Issued

2004

Published in
Proceedings - Shape Modeling International SMI 2004
Start page

233

End page

242

Subjects

Algorithms

•

Copyrights

•

Data reduction

•

Data structures

•

Eigenvalues and eigenfunctions

•

Geometry

•

Multimedia systems

•

Robustness (control systems)

•

Spectrum analysis

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
GCM  
Event nameEvent place
Proceedings - Shape Modeling International SMI 2004

Genova, Italy

Available on Infoscience
June 14, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/50779
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