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conference paper

Early Wire Characterization for Predictable Network-on-Chip Global Interconnects

Hatirnaz, Ilhan
•
Badel, Stéphane
•
Pazos, Nuria
Show more
2007
Proceedings of the ACM International Workshop on System Level Interconnect Prediction
ACM International Workshop on System Level Interconnect Prediction (SLIP)

This work envisions a common design methodology, applicable for every interconnect level and based on early wire characterization, to provide a faster convergence to a feasible and robust design. We claim that such a novel design methodology is vital for upcoming nanometer technologies, where increased variations in both device characteristics and interconnect parameters introduce tedious design closure problems. The proposed methodology has been successfully applied to the wire synthesis of a Network-on-Chip interconnect to: (i) achieve a given delay and noise goals, and (ii) attain a more power-efficient design with respect to existing techniques.

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Type
conference paper
DOI
10.1145/1231956.1231969
Web of Science ID

WOS:000265963700009

Author(s)
Hatirnaz, Ilhan
Badel, Stéphane
Pazos, Nuria
Leblebici, Yusuf  
Murali, Srinivasan  
Atienza, David  
De Micheli, Giovanni  
Date Issued

2007

Publisher

ACM Press New York, NY, US

Published in
Proceedings of the ACM International Workshop on System Level Interconnect Prediction
Start page

57

End page

64

Subjects

Wire characterization

•

Design methodology

•

Global interconnects

•

NoCs

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSM  
LSI1  
ESL  
Event nameEvent placeEvent date
ACM International Workshop on System Level Interconnect Prediction (SLIP)

Austin, Texas, USA

March 17-18

Available on Infoscience
January 17, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/239508
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