Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Preserving Self-Duality During Logic Synthesis for Emerging Reconfigurable Nanotechnologies
 
conference paper

Preserving Self-Duality During Logic Synthesis for Emerging Reconfigurable Nanotechnologies

Rai, Shubham
•
Riener, Heinz  
•
De Micheli, Giovanni  
Show more
February 5, 2021
Proceedings of the 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE 2021)
DATE 2021 Design, Automation and Test in Europe Conference

Emerging reconfigurable nanotechnologies allow the implementation of self-dual functions with a fewer number of transistors as compared to traditional CMOS technologies. To achieve better area results for Reconfigurable Field-Effect Transistors (RFET)-based circuits, a large portion of a logic representation must be mapped to self-dual logic gates. This, in turn, depends upon how self-duality is preserved in the logic representation during logic optimization and technology mapping. In the present work, we develop Boolean size-optimization methods– a rewriting and a resubstitution algorithms using Xor-Majority Graphs(XMGs) as a logic representation aiming at better preserving self-duality during logic optimization. XMGs are more compact for both unate and binate logic functions as compared to conventional logic representations such as And-Inverter Graphs(AIGs) or Majority-Inverter Graphs (MIGs). We evaluate the proposed algorithm over crafted benchmarks (with various levels of self-duality), and cryptographic benchmarks. For cryptographic benchmarks with a high self-duality ratio, the XMG-based logic optimisation flow can achieve an area reduction of up to17% when compared to AIG-based optimization flows implemented in the academic logic synthesis tool ABC.

  • Files
  • Details
  • Metrics
Type
conference paper
DOI
10.23919/DATE51398.2021.9474112
Web of Science ID

WOS:000805289900066

Author(s)
Rai, Shubham
Riener, Heinz  
De Micheli, Giovanni  
Kumar, Akash  
Date Issued

2021-02-05

Publisher

IEEE

Published in
Proceedings of the 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE 2021)
ISBN of the book

978-3-9819263-5-4

Start page

354

End page

359

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSI1  
LSI2  
Event nameEvent placeEvent date
DATE 2021 Design, Automation and Test in Europe Conference

Virtual Conference

February 1-5, 2021

Available on Infoscience
May 14, 2021
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/178019
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés