conference paper

Scanning Probe with Tuning Fork Sensor, Microfabricated Silicon Cantilever and Conductive Tip for Microscopy at Cryogenic Temperature

Akiyama, T.  
•
Suter, K.
•
de Rooij, N. F.  
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2005
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques STM2005