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  4. An 8-Bit 800 MS/s Loop-Unrolled SAR ADC With Common-Mode Adaptive Background Offset Calibration in 28 nm FDSOI
 
research article

An 8-Bit 800 MS/s Loop-Unrolled SAR ADC With Common-Mode Adaptive Background Offset Calibration in 28 nm FDSOI

Akkaya, Ayca  
•
Celik, Firat  
•
Leblebici, Yusuf  
July 1, 2021
Ieee Transactions On Circuits And Systems I-Regular Papers

This paper presents a low-power single-channel 8-bit loop-unrolled (LU) successive approximation register (SAR) analog-to-digital-converter (ADC) with a novel common-mode adaptive background comparator offset calibration scheme. LU-SAR ADCs use multiple comparators to reduce the SAR loop delay. Offset mismatch between the comparators severely degrades the effective resolution. This paper addresses the common-mode voltage variation in the LU-SAR architecture due to comparator kickback and the problems related to the common-mode dependency of the comparator offset. The proposed offset calibration scheme ensures that the comparators are calibrated at the same input common-mode voltage at which they each operate during the SAR conversion to prevent the common-mode dependent offset mismatch between them. Moreover, the proposed ADC design exploits the common-mode variation immunity of the proposed calibration scheme to optimize the figure-of-merit (FoM). The prototype ADC manufactured in 28nm FDSOI CMOS achieves 42.57dB signal-to-noise-and-distortion ratio and 22.8fJ/conv.-step FoM at 800MS/s with near Nyquist frequency input, and occupies an area of 0.0037mm(2).

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