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  4. Scan-Rate-Dependent Ion Current Rectification and Rectification Inversion in Charged Conical Nanopores
 
research article

Scan-Rate-Dependent Ion Current Rectification and Rectification Inversion in Charged Conical Nanopores

Momotenko, Dmitry  
•
Girault, Hubert H.  
2011
Journal of the American Chemical Society

Herein we report a theoretical study of diode-like behavior of negatively charged (e.g., glass or silica) nanopores at different potential scan rates (1-1000 V center dot s(-1)). Finite element simulations were used to determine current-voltage characteristics of conical nanop ores at various electrolyte concentrations. This study demonstrates that significant changes in rectification behavior can be observed at high scan rates because the mass transport of ionic species appears sluggish on the time scale of the voltage scan. In particular, it explains the influence of the potential scan rate on the nanopore rectifying properties in the cases of classical rectification, rectification inversion, and the "transition" rectification domain where the rectification direction in the nanopore could be modulated according to the applied scan rate.

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Type
research article
DOI
10.1021/ja2048368
Web of Science ID

WOS:000295148100008

Author(s)
Momotenko, Dmitry  
Girault, Hubert H.  
Date Issued

2011

Published in
Journal of the American Chemical Society
Volume

133

Issue

37

Start page

14496

End page

14499

Subjects

Surface-Charge

•

Nanopipettes

•

Glass

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LEPA  
Available on Infoscience
December 16, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/73472
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