Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density

An assessment of the fault-tolerance properties of single-ended and differential signaling is shown in the context of a high defect density environment, using a robust error-absorbing circuit architecture. A software tool based on Monte-Carlo simulations is used for the reliability analysis of the examined logic families. A benefit of the differential circuit over standard single-ended is shown in case of complex systems. Moreover, analysis of reliability of different circuits and discussion on the optimal granularity of redundant blocks was made.


Published in:
International Joint Conference on Neural Networks (IJCNN), 2771- 2778
Presented at:
International Joint Conference on Neural Networks (IJCNN), Vancouver, BC, Canada, July 16-21
Year:
2006
Publisher:
IEEE
Keywords:
Laboratories:




 Record created 2006-12-07, last modified 2018-03-17

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