IR-SNOM on lithium fluoride films with regular arrays based on colour centres

LiF films have been grown on silicon substrate, irradiated with soft x-rays to create fluorescent regular micrometric-spaced arrays based on colour centres, and studied by Scanning Near-field Optical Microscope (SNOM). Strong variations in the local reflectivity have been observed in the infrared region between 6.1 and 9.2 mum and tentatively ascribed to a modulated variation of the refractive index of the coloured zone with respect to that of the uncoloured LiF matrix. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.


Published in:
5th International Conference on Optics of Surgaces and Interfaces, 3075-3080
Year:
2003
Publisher:
Wiley-Vch, Inc
Keywords:
Note:
CNR, Ist Stuttura Mat, Rome, I-00133 Italy.Cricenti, A, CNR, Ist Stuttura Mat, Via Fosso Cavaliere 100, Rome, I-00133 Italy.
ISI Document Delivery No.: BY29U
Cited Reference Count: 20
OSI-V
Article
5th International Conference on Optics of Surfaces and Interfaces
MAY 26-30, 2003
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 Record created 2006-10-03, last modified 2018-03-18


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