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IR-SNOM on lithium fluoride films with regular arrays based on colour centres

LiF films have been grown on silicon substrate, irradiated with soft x-rays to create fluorescent regular micrometric-spaced arrays based on colour centres, and studied by Scanning Near-field Optical Microscope (SNOM). Strong variations in the local reflectivity have been observed in the infrared region between 6.1 and 9.2 mum and tentatively ascribed to a modulated variation of the refractive index of the coloured zone with respect to that of the uncoloured LiF matrix. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

    Keywords: FIELD OPTICAL MICROSCOPE ; PLASMA SOURCE ; LIF CRYSTALS

    Note:

    CNR, Ist Stuttura Mat, Rome, I-00133 Italy.Cricenti, A, CNR, Ist Stuttura Mat, Via Fosso Cavaliere 100, Rome, I-00133 Italy.

    ISI Document Delivery No.: BY29U

    Cited Reference Count: 20

    OSI-V

    Article

    5th International Conference on Optics of Surfaces and Interfaces

    MAY 26-30, 2003

    LEON, MEXICO

    605 THIRD AVE, NEW YORK, NY 10158-0012 USA

    Reference

    • LSE-CHAPTER-2003-001

    Record created on 2006-10-03, modified on 2016-08-08

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