Using photoelectron emission microscopy with hard-X-rays

We present several successful test cases of using photoelectron emission microscopy (PEEM) for photon energy up to 25 keV. First, the full extended X-ray absorption fine structure analysis was implemented in areas as small as 100 mum(2) for transition-metal K edge absorption spectra and, therefore, demonstrated the feasibility of combining structural and chemical analysis with hard-X-ray absorption spectroscopy with high lateral resolution. We also show that PEEM can be used in a transmission (radiography) mode as an imaging detector for hard-X-ray, This approach again leads to the unprecedented 0.3 mum lateral resolution, particularly critical for the use of coherence-based phase contrast techniques in real time X-ray radiology. (C) 2001 Elsevier Science B.V. All rights reserved.


Published in:
Surface Science, 480, 3, 188-195
Year:
2001
ISSN:
0039-6028
Keywords:
Note:
Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Acad Sinica, Inst Phys, Taipei, Taiwan. Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA. Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang, South Korea. Univ Mainz, Inst Phys, D-6500 Mainz, Germany. Sincrotrone Trieste SCpA, Trieste, Italy. Hwu, Y, Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland.
ISI Document Delivery No.: 442KY
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 Record created 2006-10-03, last modified 2018-03-18


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