Photoelectron spectromicroscopy, the combination of conventional photoelectron spectroscopy and high lateral resolution, is a novel technique that exploits the high brightness of the most recent synchrotron sources. We briefly review its main implementation modes and present some examples of applications, with particular emphasis on semiconductor interface research.
Title
Photoelectron microscopy and its applications to semiconductor science
Published in
Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers
Volume
38
Pages
8-13
Date
1999
ISSN
0021-4922
Note
Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Sincrotrone Trieste, Trieste, Italy. Margaritondo, G, Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland.
ISI Document Delivery No.: 240AT
Suppl. 1
Record creation date
2006-10-03
