research article
Photoelectron microscopy and its applications to semiconductor science
Photoelectron spectromicroscopy, the combination of conventional photoelectron spectroscopy and high lateral resolution, is a novel technique that exploits the high brightness of the most recent synchrotron sources. We briefly review its main implementation modes and present some examples of applications, with particular emphasis on semiconductor interface research.
Type
research article
Web of Science ID
WOS:000082804000003
Author(s)
Date Issued
1999
Volume
38
Start page
8
End page
13
Note
Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Sincrotrone Trieste, Trieste, Italy. Margaritondo, G, Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland.
ISI Document Delivery No.: 240AT
Suppl. 1
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
Available on Infoscience
October 3, 2006
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