Photoelectron microscopy and its applications to semiconductor science

Photoelectron spectromicroscopy, the combination of conventional photoelectron spectroscopy and high lateral resolution, is a novel technique that exploits the high brightness of the most recent synchrotron sources. We briefly review its main implementation modes and present some examples of applications, with particular emphasis on semiconductor interface research.


Published in:
Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, 38, 8-13
Year:
1999
ISSN:
0021-4922
Keywords:
Note:
Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Sincrotrone Trieste, Trieste, Italy. Margaritondo, G, Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland.
ISI Document Delivery No.: 240AT
Suppl. 1
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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