Coherence based contrast enhancement in x-ray radiography with a photoelectron microscope

We show that a photoelectron spectromicroscope of the photoelectron emission microscope type can be used as an x-ray imaging detector for radiology. Using high penetration hard-x-ray photons (wavelength < 0.1 nm), samples as thick as a few millimeters can be imaged with submicron resolution. The high imaging resolution enables us to substantially decrease the object-detector distance needed to observe coherent based contrast enhancement with respect to the standard film-based detection technique. Our result implies several advantages, the most important being a marked reduction of the required source emittance for contrast enhanced radiology. (C) 1999 American Institute of Physics. [S0003-6951(99)00842-6].


Published in:
Applied Physics Letters, 75, 16, 2377-2379
Year:
1999
ISSN:
0003-6951
Keywords:
Note:
Acad Sinica, Inst Phys, Taipei, Taiwan. Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA. Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang, South Korea. Kwangju Inst Sci & Technol, Ctr Elect Mat Res, Kwangju, South Korea. Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju, South Korea. Sincrotrone Trieste SCPA, Trieste, Italy. Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Hwu, Y, Acad Sinica, Inst Phys, Taipei, Taiwan.
ISI Document Delivery No.: 245LU
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 Record created 2006-10-03, last modified 2018-03-18


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