Infoscience

Journal article

Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms

Tests performed in different regimes reveal the interplay of two edge-enhancement mechanisms in radiological images taken with coherent synchrotron light. The relative weight of the two mechanisms, related to refraction and to Fresnel edge diffraction, can be changed in a controlled way. This makes it possible to obtain different images of the same object with complementary information. (C) 1999 American Institute of Physics. [S0021-8979(99)03720-2].

    Keywords: HARD X-RAYS ; CONTRAST ; RESOLUTION

    Note:

    Acad Sinica, Inst Phys, Taipei 11529, Taiwan. Tatung Inst Technol, Dept Mat Sci, Taipei 104, Taiwan. Natl Univ Singapore, Dept Mat Sci, Singapore 119260, Singapore. Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA. Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea. Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 506712, South Korea. Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea. Sincrotrone Trieste, I-34012 Trieste, Italy. Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Hwu, Y, Acad Sinica, Inst Phys, Taipei 11529, Taiwan.

    ISI Document Delivery No.: 240TB

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    Record created on 2006-10-03, modified on 2016-08-08

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