Investigation of electrical degradation effects in ferroelectric thin film based tunable microwave components
The impact of electrical stressing on the microwave performance of the SrTiO3 films deposited onto different substrates (MgO and LaAlO3) by pulsed laser deposition has been investigated. The most important characteristics of the tunable microwave components like tunability and loss tangent have been monitored. It has been found that electrical degradation effects, being sensitive to the device operating conditions and ferroelectric film properties, are large enough to affect the performance of ferroelectric-based tunable microwave devices within the expected operating time.
Astafiev, K Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland Natl Renewable Energy Lab, Golden, CO 80401 USA
Cited References Count:13
Record created on 2006-08-21, modified on 2016-08-08