Charge relaxation at the interfaces of low-voltage ferroelectric film capacitors: Fatigue endurance and size effects

A unified approach for analysis of polarization fatigue and size effects on ferroelectric switching in relationship with injection and entrapment of charge at the interfacial layer of the ferroelectric film is developed. The proposed model suggests that an enhancement of the entrapped charge relaxation at the interfaces has a positive impact on both the polarization fatigue and size effects. This concept is implemented experimentally by introducing a thin conductive oxide (RuO2) layer into the top interface of the conventional PZT film capacitors with Pt electrodes. Capacitors prepared in this way show a substantial improvement of fatigue performance and withstand well the thickness downscaling.


Published in:
Ferroelectrics, 258, 1-4, 513-522
Year:
2001
ISSN:
0015-0193
Keywords:
Note:
Stolichnov, I Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland
580BT
Times Cited:0
Cited References Count:10
Laboratories:




 Record created 2006-08-21, last modified 2018-03-17


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