Loading...
research article
A model of transport nonuniversality in thick-film resistors
We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as a consequence of wide distribution of interparticle tunneling distances. © 2003 American Institute of Physics.
Loading...
Name
2003 Grimaldi nonuniversalité résistances - modèle.pdf
Access type
restricted
Size
46.07 KB
Format
Adobe PDF
Checksum (MD5)
4979f66c334d3ee4ce9e6757fdefeec8