A High Fault-Coverage Design-for-Testability Approach for a MIMD Based Multimedia Processor
1997
Details
Title
A High Fault-Coverage Design-for-Testability Approach for a MIMD Based Multimedia Processor
Author(s)
Gumm, M. ; Brocci, M. ; Mombers, F.
Published in
European Design & Test Conference and Exhibition, Paris La Defense
Date
1997
Publisher
Berlin, IEEE
Keywords
Laboratories
LTS
SCI-STI-MM
SCI-STI-MM
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > SCI-STI-MM - SCI STI MM Group
Scientific production and competences > STI - School of Engineering > STI Archives > LTS - Signal Processing Laboratory
Conference Papers
Work produced at EPFL
Published
Scientific production and competences > STI - School of Engineering > STI Archives > LTS - Signal Processing Laboratory
Conference Papers
Work produced at EPFL
Published
Record creation date
2006-06-14