Characterization of microstructures by x-ray microdiffraction and topography
1984
Details
Title
Characterization of microstructures by x-ray microdiffraction and topography
Author(s)
Rappaz, M. ; Kaspar, M. ; Blank, E. ; Andersen, N. H.
Published in
Microstructural Characterization of Materials by Non-microscopical Techniques
Pages
443
Date
1984
Publisher
Denmark, Riso Int. Conf.
Laboratories
LSMX
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LSMX - Computational Materials Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2005-11-22