Micromachined atomic force microprobe with integrated capacitive read-out

We developed a micromachining process for the fabrication of highly sensitive capacitor probes to be used for displacement measurement of an atomic force cantilever. The capacitive structure consists of two adjacent single-crystal silicon beams, one carrying a sharp tip for the force interaction, the other being the counter-electrode. The air gap of 1.5 pm separating the two electrodes is obtained by removal of the oxide in between by selective etching. The capacitance has a typical value of -0.2 pF. Forces acting on the tip induce a bending of the cantilever and change the caDacitance which can be detected by electronic circuits.


Published in:
Journal Micromechanical Microengineering, 2, 218-220
Year:
1992
Note:
65
Laboratories:




 Record created 2005-11-02, last modified 2018-03-18

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