Ionic transport phenomena in nanofluidics: Experimental and theoretical study of the exclusion-enrichment effect on a chip
In nanometer-sized apertures with charged surfaces, the extension of the electrical double layer results in the electrostatic exclusion of co-ions and enrichment in counterions, which affects the permselectivity of such structures. A modeling of this phenomenon is proposed and is compared with quantitative measurements of the ionic permeability change of a Pyrex nanoslit at low ionic strength. The comparison of experimental results with theoretical predictions justifies that electrostatic forces are the governing forces in nanofluidics.
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Plecis, A., Schoch, R. B., & Renaud, P. (2005). Ionic transport phenomena in nanofluidics: Experimental and theoretical study of the exclusion-enrichment effect on a chip. Nano Letters, 5(6), 1147–1155. https://doi.org/10.1021/nl050265h
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