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conference paper not in proceedings
A Novel Circuit-Level Fault-Tolerance Concept for Boolean Gates Using Low-Yield Nanometer-Scale Transistors
2004
Type
conference paper not in proceedings
Authors
Publication date
2004
Note
2004 International Joint Conference on Neural Networks, Budapest, July 2004
EPFL units
Event name | Event place | Event date |
Budapest | July 2004 | |
Available on Infoscience
August 30, 2005
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