Spatially Adaptive Wavelet Thresholding with Context Modeling for Image Denoising


Published in:
Proc. IEEE International Conference on Image Processing, 1, 535-539
Presented at:
ICIP 98, Chicago, Illinois, USA, 4-7 October 1998
Year:
1998
Laboratories:




 Record created 2005-04-18, last modified 2018-03-17

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