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doctoral thesis
Hot electron degradation in short-channel MOS transistors
Acovic, Alexandre
1990
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Name
EPFL_TH825.pdf
Access type
restricted
Size
8.96 MB
Format
Adobe PDF
Checksum (MD5)
15f80c09c639265fd2dc6097eca671c9
Hot electron degradation in short-channel MOS transistors
EPFL_TH825.pdf
restricted
8.96 MB
Adobe PDF
15f80c09c639265fd2dc6097eca671c9