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research article

A Full-Wave Reference Simulator for Computing Surface Reflectance

Yu, Yunchen
•
Xia, Mengqi  
•
Walter, Bruce
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August 1, 2023
Acm Transactions On Graphics

Computing light reflection from rough surfaces is an important topic in computer graphics. Reflection models developed based on geometric optics fail to capture wave effects such as diffraction and interference, while existing models based on physical optics approximations give erroneous predictions under many circumstances (e.g. when multiple scattering from the surface cannot be ignored). We present a scalable 3D full-wave simulator for computing reference solutions to surface scattering problems, which can be used to evaluate and guide the development of approximate models for rendering. We investigate the range of validity for some existing wave optics based reflection models; our results confirm these models for low-roughness surfaces but also show that prior rendering methods do not accurately predict the scattering behavior of some types of surfaces. Our simulator is based on the boundary element method (BEM) and accelerated using the adaptive integral method (AIM), and is implemented to execute on modern GPUs. We demonstrate the simulator on domains up to 60 x 60 x 10 wavelengths, involving surface samples with significant height variations. Furthermore, we propose a new system for efficiently computing BRDF values for large numbers of incident and outgoing directions at once, by combining small simulations to characterize larger areas.

Our simulator will be released as an open-source toolkit for computing surface scattering.

  • Details
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Type
research article
DOI
10.1145/3592414
Web of Science ID

WOS:001044671300075

Author(s)
Yu, Yunchen
Xia, Mengqi  
Walter, Bruce
Michielssen, Eric
Marschner, Steve
Date Issued

2023-08-01

Publisher

ASSOC COMPUTING MACHINERY

Published in
Acm Transactions On Graphics
Volume

42

Issue

4

Start page

109

Subjects

Computer Science, Software Engineering

•

Computer Science

•

wave optics

•

material appearance

•

scattering

•

diffraction

•

integral method

•

rough surfaces

•

propagation

•

light

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
RGL  
Available on Infoscience
September 25, 2023
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/200993
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