conference paper
Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology
January 1, 2022
Essderc 2022 - Ieee 52Nd European Solid-State Device Research Conference (Essderc)
This paper presents the RF characterization and modeling of a 22nm FDSOI technology down to 3.3K for quantum computing applications. The equivalent small-signal components are extracted analytically and automatically from the de-embedded two-port Y -parameters using an iteratively re-weighted least-squares method. The dynamic self-heating effect impacting R(Y-22) is characterized at different temperatures and bias points.
Type
conference paper
Web of Science ID
WOS:000904209900014
Author(s)
Zhao, Zhixing
Lehmann, Steffen
Kretzschmar, Claudia
Date Issued
2022-01-01
Publisher
Publisher place
New York
Published in
Essderc 2022 - Ieee 52Nd European Solid-State Device Research Conference (Essderc)
ISBN of the book
978-1-6654-8497-8
Series title/Series vol.
Proceedings of the European Solid-State Device Research Conference
Start page
269
End page
272
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Milan, ITALY | Sep 19-22, 2022 | |
Available on Infoscience
February 13, 2023
Use this identifier to reference this record