Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protection
2022
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Title
Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protection
Author(s)
Li, Chengmin ; Sheng, Jing ; Dujic, Drazen
Published in
IEEE Transactions on Industrial Electronics
Pages
1-10
Date
2022
Laboratories
PEL
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PEL - Power Electronics Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2022-12-02