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  4. Poisoning Effects of Cerium Oxide (CeO2) on the Performance of Proton Exchange Membrane Fuel Cells (PEMFCs)
 
research article

Poisoning Effects of Cerium Oxide (CeO2) on the Performance of Proton Exchange Membrane Fuel Cells (PEMFCs)

Pourrahmani, Hossein  
•
Matian, Mardit
•
Van Herle, Jan  
June 1, 2022
Chemengineering

In this study, the poisoning effects of cerium oxide (CeO2) as the contaminant on the performance of proton exchange membrane fuel cells (PEMFCs) are evaluated. An experimental setup was developed to analyze the performance characteristic (I-V) curves in contaminated and non-contaminated conditions. Focused ion-beam scanning electron microscopy (FIB-SEM) cross-section images were obtained as an input for the energy dispersive X-ray (EDX) analysis. The results of the EDX analysis verified the presence of CeO2 in the contaminated membrane electrode assembly (MEA), in addition to fluorine and sulfur. EDX analysis also revealed that as a result of CeO2 contamination, sulfur and fluorine would be distributed all around the MEA, instead of being only in the membrane. The results illustrate that hydrofluoric acid (HF), sulfuric acid (H2SO4), and fluorinated polymer fragments are released, which enhance the crossover of the reactant gases through the membrane, hence reducing the cell's performance. The I-V characteristic curves proved that the non-contaminated PEMFC setup had double the performance of the contaminated PEMFC.

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Type
research article
DOI
10.3390/chemengineering6030036
Web of Science ID

WOS:000816055300001

Author(s)
Pourrahmani, Hossein  
Matian, Mardit
Van Herle, Jan  
Date Issued

2022-06-01

Publisher

MDPI

Published in
Chemengineering
Volume

6

Issue

3

Start page

36

Subjects

Engineering, Chemical

•

Engineering

•

proton exchange membrane fuel cell (pemfc)

•

cerium oxide poisoning effect

•

focused ion-beam scanning electron microscopy (fib-sem)

•

energy dispersive x-ray (edx)

•

i-v characteristics

•

membrane electrode assembly (mea)

•

chloride contamination

•

cathode

•

durability

•

migration

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
SCI-STI-JVH  
Available on Infoscience
July 4, 2022
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/188853
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