Advanced method for electrical characterization of carrier-selective passivating contacts using transfer-length-method measurements under variable illumination

Senaud, L.-L.; Procel, P.; Christmann, G.; Descoeudres, A.; Geissbühler, J.; Allebé, C.; Badel, N.; Wyss, P.; Boccard, M.; Isabella, O.; Zeman, M.; Nicolay, S.; Despeisse, M.; Ballif, C.; Paviet-Salomon, B.

doi:10.1063/5.0042854

research article

Advanced method for electrical characterization of carrier-selective passivating contacts using transfer-length-method measurements under variable illumination

Senaud, L.-L.

•

Procel, P.

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Christmann, G.

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May 21, 2021

Journal of Applied Physics

Name

JAP21-MD-00056.pdf

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Postprint

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openaccess

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CC BY

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1.49 MB

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Adobe PDF

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