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research article
High-resolution low-dose scanning transmission electron microscopy
November 14, 2009
During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording with a conventional field-emission gun STEM, while maintaining the high-resolution capability of the instrument. Our findings show that a combination of reduced pixel dwell time and reduced gun current can achieve radiation doses comparable to low-dose TEM.
Type
research article
Authors
Publication date
2009-11-14
Publisher
Published in
Volume
59
Issue
2
Start page
103
End page
112
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
February 13, 2020
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