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  4. A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS Technology
 
research article

A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS Technology

Ximenes, Augusto Ronchini  
•
Padmanabhan, Preethi  
•
Lee, Myung-Jae  
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November 1, 2019
IEEE Journal of Solid-State Circuits

This article introduces a modular, direct time-of-flight (TOF) depth sensor. Each module is digitally synthesized and features a 2 $\times $ (8 $\times $ 8) single-photon avalanche diode (SPAD) pixel array, an edge-sensitive decision tree, a shared time-to-digital converter (TDC), 21-bit per-pixel memory, and in-locus data processing. Each module operates autonomously, by internal data acquisition, management, and storage, being periodically read out by an external access. The prototype was fabricated in a TSMC 3-D-stacked 45/65-nm CMOS technology, featuring backside illumination (BSI) SPAD detectors on the top tier, and readout circuit on the bottom tier. The sensor was characterized by single-point measurements, in two different modes of resolution and range. In low-resolution mode, a maximum of 300-m and 80-cm accuracy was recorded; on the other hand, in high-resolution mode, the maximum range and accuracy were 150 m and 7 cm, respectively. The module was also used in a flexible scanning light detection and ranging (LiDAR) system, where a 256 $\times $ 256 depth map, with millimeter precision, was obtained. A laser signature based on pulse-position modulation (PPM) is also proposed, achieving a maximum of 28-dB interference reduction.

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Type
research article
DOI
10.1109/JSSC.2019.2938412
Web of Science ID

WOS:000493176300024

Author(s)
Ximenes, Augusto Ronchini  
Padmanabhan, Preethi  
Lee, Myung-Jae  
Yamashita, Yuichiro
Yaung, Dun-Nian
Charbon, Edoardo  
Date Issued

2019-11-01

Published in
IEEE Journal of Solid-State Circuits
Volume

54

Issue

11

Start page

3203

End page

3214

Subjects

Engineering, Electrical & Electronic

•

Engineering

•

decision trees

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laser radar

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delays

•

cmos technology

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distance measurement

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interference

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depth sensor

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interference reduction

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laser signature

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light detection and ranging (lidar)

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ranging imaging

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single-photon avalanche diode (spad)

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3-d-stacking

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time-of-flight (tof) imaging

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camera

Editorial or Peer reviewed

REVIEWED

Written at

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November 15, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/163132
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