Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

research article

Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

Ramasse, Q.

•

Alem, N.

•

Zettl, A.

2012

Microscopy and Microanalysis

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S1431927612009488.pdf

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Publisher's version

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openaccess

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617.78 KB

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Adobe PDF

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