Focused Ion Beam Nano-Tomography Using Different Detectors


Published in:
Microscopy and Microanalysis, 17, S2, 882-883
Year:
2011
Publisher:
Cambridge, Cambridge University Press
ISSN:
1431-9276
1435-8115
Note:
National Licences
Additional link:
Laboratories:




 Record created 2019-08-23, last modified 2020-01-20

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