Nanoscale Analysis by EFTEM and FIB-Tomography for Optimization of Thin-Film Silicon Solar Cells
2010
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Title
Nanoscale Analysis by EFTEM and FIB-Tomography for Optimization of Thin-Film Silicon Solar Cells
Author(s)
Alexander, Dtl ; Nicolay, S ; Cuony, P ; Cantoni, M ; Ballif, C
Published in
Microscopy and Microanalysis
Volume
16
Issue
S2
Pages
1336-1337
Date
2010
Publisher
Cambridge, Cambridge University Press
ISSN
1431-9276
1435-8115
1435-8115
Note
National Licences
Laboratories
LSME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > LSME - Electron Spectrometry and Microscopy Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-08-23