Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study


Published in:
Microscopy and Microanalysis, 18, S2, 1516-1517
Year:
2012
Publisher:
Cambridge, Cambridge University Press
ISSN:
1431-9276
1435-8115
Note:
National Licences
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Note: The status of this file is: Anyone


 Record created 2019-08-23, last modified 2020-05-19

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