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conference paper not in proceedings
Low frequency noise characterization and modeling of SiGe HBT featuring LASER annealing in a 55-nm CMOS node
2019
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Name
ICNF_2019_Full_Paper_59.pdf
Access type
openaccess
Size
362 KB
Format
Adobe PDF
Checksum (MD5)
5a47f02b8f57e565d6267399de0e911d