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conference paper not in proceedings
Integrated W-Band Measurement System Combining IMD, S-Parameters and Noise Figure Suitable for Coax, Waveguide and On-Wafer Test
Dunsmore, Joel
•
Singh, Suren
2019
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Name
ICNF_2019_Full_Paper_57.pdf
Access type
openaccess
Size
398.74 KB
Format
Adobe PDF
Checksum (MD5)
ed50081aa3af1864895fae85c95f1f72