Characterization of semiconductor nanocrystals using advanced NMR spectroscopy
2019
Details
Title
Characterization of semiconductor nanocrystals using advanced NMR spectroscopy
Author(s)
Piveteau, Laura ; Ong, Ta-Chung ; Walder, Brennan ; Dirin, Dmitry ; Moscheni, Daniele ; Schneider, Barbara ; Protesescu, Loredana ; Masciocchi, Norberto ; Guagliardi, Antonietta ; Emsley, Lyndon ; Coperet, Christophe ; Kovalenko, Maksym
Published in
Abstracts Of Papers Of The American Chemical Society
Volume
257
Conference
National Meeting of the American-Chemical-Society (ACS), Mar 31-Apr 04, 2019, Orlando, FL
Date
2019-03-31
Publisher
Washington, AMER CHEMICAL SOC
ISSN
0065-7727
Other identifier(s)
View record in Web of Science
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > ISIC - Institute of Chemical Sciences and Engineering > ISIC-GE - Institute of Chemical Sciences and Engineering
Scientific production and competences > SB - School of Basic Sciences > ISIC - Institute of Chemical Sciences and Engineering > LRM - Laboratory of Magnetic Resonance
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Scientific production and competences > SB - School of Basic Sciences > ISIC - Institute of Chemical Sciences and Engineering > LRM - Laboratory of Magnetic Resonance
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2019-08-22