1/f Noise in Fully Integrated Electrolytically Gated FinFETs with Fin Width Down to 20nm

conference paper not in proceedings

1/f Noise in Fully Integrated Electrolytically Gated FinFETs with Fin Width Down to 20nm

Martens, Koen

•

Du Bois, Bert

•

Kong Siew, Yong

2019

25th International Conference on Noise and Fluctuations (ICNF 2019)

Name

ICNF_2019_Full_Paper_14.pdf

Access type

openaccess

Size

464.93 KB

Format

Adobe PDF

Checksum (MD5)

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