sample holder for low-temperature insitu deformation tests in 200 kv transmission electron-microscope


Published in:
Helvetica Physica Acta, 52, 1, 30
Year:
1979
ISSN:
0018-0238
Additional link:
Laboratories:


Note: The status of this file is: Anyone


 Record created 2019-07-04, last modified 2020-04-20

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