sample holder for low-temperature insitu deformation tests in 200 kv transmission electron-microscope
1979
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Title
sample holder for low-temperature insitu deformation tests in 200 kv transmission electron-microscope
Author(s)
GOTTHARDT, R ; BUFFAT, P
Published in
Helvetica Physica Acta
Volume
52
Issue
1
Pages
30
Date
1979
ISSN
0018-0238
Additional link
E-Periodica
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-07-04