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research article
sample holder for low-temperature insitu deformation tests in 200 kv transmission electron-microscope
GOTTHARDT, R
•
BUFFAT, P
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Name
Helvetica_Physica_Acta_FSPG_1979_52_30.pdf
Type
Publisher's version
Access type
openaccess
Size
1.05 MB
Format
Adobe PDF
Checksum (MD5)
35d582c9bff0f920e733587b2625a513