Home > Advanced transmission electron-microscopy in optoelectronics and microelectronics - state-of-the-art, current problems and possible improvements
 

Advanced transmission electron-microscopy in optoelectronics and microelectronics - state-of-the-art, current problems and possible improvements

Buffat, P. A.

Published in:
Helvetica Physica Acta, 60, 2, 252
Year:
1987
ISSN:
0018-0238
Additional link:
E-Periodica
Laboratories:
CIME

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published

Note: The status of this file is: Anyone


 Record created 2019-07-04, last modified 2020-05-26

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