transmission and reflection electron-microscopy on cleaved edges of iii-v-multilayered structures


Published in:
NATO ADVANCED SCIENCE INSTITUTES SERIES, SERIES B, PHYSICS
Presented at:
evaluation of advanced semiconductor materials by electron microscopy, 1989
Year:
1989
Publisher:
NATO
ISBN:
0-306-43362-1
Laboratories:




 Record created 2019-07-04, last modified 2019-08-12


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