Transmission and Reflection Electron Microscopy on Cleaved Edges of III-V Multilayered Structures


Editor(s):
Cherns, D
Published in:
NATO ASI Series, 203, 319-334
Presented at:
Evaluation of Advanced Semiconductor Materials by Electron Microscopy, 1989
Year:
1989
Publisher:
NATO
ISBN:
0-306-43362-1
Other identifiers:
Laboratories:




 Record created 2019-07-04, last modified 2020-06-08


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