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conference paper
An Accurate kTC Noise Analysis of CDS Circuits
June 27, 2018
2018 16Th Ieee International New Circuits And Systems Conference (Newcas)
This work presents an analytical analysis of the thermal noise in widely used correlated double-sampling (CDS) circuits. The objective is to provide designers with simplified noise formulas essential for the design and optimization of such blocks. The obtained analytical results are confirmed with SpectreRF noise, SpectreRF transient noise and ELDO transient noise simulations.
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An Accurate kTC Noise Analysis of CDS Circuits.pdf
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