Erratum: Influence of the thickness of a nanometric copper interlayer on Au/dielectric thermal boundary conductance (vol 124, 105304, 2018)


Published in:
Journal Of Applied Physics, 125, 14, 149901
Year:
Apr 14 2019
Publisher:
Melville, AMER INST PHYSICS
ISSN:
0021-8979
1089-7550
Laboratories:




 Record created 2019-04-28, last modified 2019-06-19


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