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research article

Charge-Based EPFL HEMT Model

Jazaeri, Farzan  
•
Sallese, Jean-Michel  
March 1, 2019
Ieee Transactions On Electron Devices

This paper presents a design-oriented charge-based model for dc operation of AlGaAs/GaAs and AlGaN/GaN-based high-mobility field-effect transistors. The intrinsic model is physics-based and does not introduce any empirical parameter. The central concept is based on the linear approximation of the channel charge density with respect to the surface potential, leading to explicit and continuous expressions for charges and current in all the regions of operation, including subthreshold. In addition, an effective circuit design methodology based on the pinchoff surface potential, the pinchoff voltage and the key concept of inversion coefficient (IC) is proposed, likewise for silicon MOSFET circuits.

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Type
research article
DOI
10.1109/TED.2019.2893302
Web of Science ID

WOS:000460970400013

Author(s)
Jazaeri, Farzan  
•
Sallese, Jean-Michel  
Date Issued

2019-03-01

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Published in
Ieee Transactions On Electron Devices
Volume

66

Issue

3

Start page

1218

End page

1229

Subjects

Engineering, Electrical & Electronic

•

Physics, Applied

•

Engineering

•

Physics

•

2-dimensional electron gas (2-deg)

•

compact modeling

•

gaas

•

gan

•

high-mobility field-effect transistor (hemt)

•

inversion coefficient

•

pinchoff surface potential

•

pinchoff voltage

•

quantum well (qw)

•

threshold voltage

•

algan/gan hemts

•

electron-gas

•

signal model

•

mosfet

•

linearization

•

density

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
ICLAB  
EDLAB  
Available on Infoscience
March 26, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/155728
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