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  4. Progress in single-photon avalanche diode image sensors in standard CMOS: From two-dimensional monolithic to three-dimensional-stacked technology
 
review article

Progress in single-photon avalanche diode image sensors in standard CMOS: From two-dimensional monolithic to three-dimensional-stacked technology

Lee, Myung-Jae  
•
Charbon, Edoardo  
October 1, 2018
Japanese Journal Of Applied Physics

Single-photon detection and photon counting are useful tools in many fields, from light detection and ranging (LiDAR) to biomedical imaging and from time-resolved Raman spectroscopy to quantum applications. In this context, recently, single-photon avalanche diode (SPAD) sensors in standard CMOS technology have been receiving considerable attention from both scientific and industrial communities since they can provide single-photon detection and photon-counting capabilities along with some functionalities such as time-of-arrival evaluation and histogram processing in a cost-effective manner. In this review, we provide a comprehensive view of the CMOS SPAD technology: from fundamentals to cutting-edge technologies including three-dimensional (3D)-stacked CMOS SPAD sensors. (C) 2018 The Japan Society of Applied Physics

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Type
review article
DOI
10.7567/JJAP.57.1002A3
Web of Science ID

WOS:000444416700001

Author(s)
Lee, Myung-Jae  
Charbon, Edoardo  
Date Issued

2018-10-01

Publisher

IOP PUBLISHING LTD

Published in
Japanese Journal Of Applied Physics
Volume

57

Issue

10

Article Number

1002A3

Subjects

Physics, Applied

•

Physics

•

spad

•

resolution

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
AQUA  
Available on Infoscience
December 13, 2018
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/152863
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