CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity
2018
Details
Title
CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity
Author(s)
Zhang, Jun-Rui ; Bellando, F. ; Rupakula, M. ; Cordero, E. Garcia ; Ebejer, N. ; Longo, J. ; Wildhaber, F. ; Guerin, H. ; Ionescu, A. M.
Published in
2018 76Th Device Research Conference (Drc)
Series
IEEE Device Research Conference Proceedings
Conference
76th Device Research Conference (DRC), Santa Barbara, CA, Jun 24-27, 2018
Date
2018-01-01
Publisher
New York, IEEE
ISSN
1548-3770
ISBN
978-1-5386-3028-0
Other identifier(s)
View record in Web of Science
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2018-12-13