CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity


Published in:
2018 76Th Device Research Conference (Drc)
Presented at:
76th Device Research Conference (DRC), Santa Barbara, CA, Jun 24-27, 2018
Year:
Jan 01 2018
Publisher:
New York, IEEE
ISSN:
1548-3770
ISBN:
978-1-5386-3028-0
Suggested laboratories:




 Record created 2018-12-13, last modified 2018-12-13


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