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conference paper
CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity
January 1, 2018
2018 76Th Device Research Conference (Drc)
Use this identifier to reference this record
Type
conference paper
Web of Science ID
WOS:000444728400053
Authors
Zhang, Jun-Rui
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Cordero, E. Garcia
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Ebejer, N.
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Publication date
2018-01-01
Publisher
Published in
2018 76Th Device Research Conference (Drc)
ISBN of the book
978-1-5386-3028-0
Publisher place
New York
Series title/Series vol.
IEEE Device Research Conference Proceedings
Peer reviewed
REVIEWED
EPFL units
Event name | Event place | Event date |
Santa Barbara, CA | Jun 24-27, 2018 | |
Available on Infoscience
December 13, 2018