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  4. Towards high-performance polarity-controllable FETs with 2D materials, 2018 Design
 
conference paper

Towards high-performance polarity-controllable FETs with 2D materials, 2018 Design

Resta, Giovanni V.
•
Gonzalez, Jorge Romero
•
Balaji, Yashwanth
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March 23, 2018
Proceedings Of The 2018 Design, Automation & Test In Europe Conference & Exhibition (Date)
Design, Automation & Test in Europe Conference & Exhibition

As scaling of conventional silicon-based electronics is reaching its ultimate limit, two-dimensional semiconducting materials of the transition-metal-dichalcogenides family, such as MoS2 and WSe2, are considered as viable candidates for next-generation electronic devices. Fully relying on electrostatic doping, polarity-controllable devices, that use additional gate terminals to modulate the Schottky barriers at source and drain, can strongly take advantages of 2D materials to achieve high on/off ratio and low leakage floor. Here, we provide an overview of the latest advances in 2D material processes and growth. Then, we report on the experimental demonstration of polarity-controllable devices fabricated on 2D-WSe2 and study the scaling trends of such devices using ballistic self-consistent quantum simulations. Finally, we discuss the circuit-level opportunities of such technology.

  • Details
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Type
conference paper
DOI
10.23919/DATE.2018.8342088
Author(s)
Resta, Giovanni V.
Gonzalez, Jorge Romero
Balaji, Yashwanth
Agarwal, Tarun
Lin, Dennis
Catthor, Francky
Radu, Iuliana P.
De Micheli, Giovanni
Gaillardon, Pierre-Emmanuel
Date Issued

2018-03-23

Publisher

IEEE

Publisher place

New York

Published in
Proceedings Of The 2018 Design, Automation & Test In Europe Conference & Exhibition (Date)
ISBN of the book

978-3-9819-2630-9

Series title/Series vol.

Design Automation and Test in Europe Conference and Exhibition

Start page

637

End page

641

Subjects

Logic gates

•

Adders

•

Two dimensional displays

•

Performance evaluation

•

Doping

•

Schottky barriers

•

Photonic band gap

Note

Acknowledgements: The authors wish to acknowledge support from NSF (grant 1644592) and by IMEC core partners CMOS program.

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSI2  
LSI1  
Event nameEvent place
Design, Automation & Test in Europe Conference & Exhibition

Dresden, Germany

Available on Infoscience
August 7, 2018
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/147660
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