Details
Title
ELAB
Formal Name (French)
Electronics Laboratory
Formal Name (English)
Electronics Laboratory
Lab Manager
Kayal, Maher
Group ID
U11978
Affiliated authors
Ajbl, Andrea
Asadi Zanjani, Nastaran
Buccella, Pietro
Bucher, Matthias
Buzzi, Isabelle
Conus, Gilbert
Coustans, Mathieu
Dal Fabbro, Paulo Augusto
Fabre, Laurent
Facchin, Stefano
Favrat, Pierre
Gaugaz, François Pierre
Gosselin, Paul
Gureev, Maxim
Jain, Sanket
Kauth, Christian
Kayal, Maher
Khabthani, Abir
Khosro Pour, Naser
Krummenacher, François
Kyriakidis, Theodoros
Lanz, Guillaume
Lilis, Georgios
Lo Conte, Fabrizio
Maréchal, Sylvain
Meinen, Cédric
Melly, Thierry Bernard
Nagel, Ira
Pastre, Marc
Raboud, Didier
Sallin, Denis
Sovilla, Jérôme
Stefanucci, Camillo
Van Cutsem, Olivier Valentin Henri
Voulgari, Evgenia
Watson, Andrew
Yermolenko, Pavlo
Asadi Zanjani, Nastaran
Buccella, Pietro
Bucher, Matthias
Buzzi, Isabelle
Conus, Gilbert
Coustans, Mathieu
Dal Fabbro, Paulo Augusto
Fabre, Laurent
Facchin, Stefano
Favrat, Pierre
Gaugaz, François Pierre
Gosselin, Paul
Gureev, Maxim
Jain, Sanket
Kauth, Christian
Kayal, Maher
Khabthani, Abir
Khosro Pour, Naser
Krummenacher, François
Kyriakidis, Theodoros
Lanz, Guillaume
Lilis, Georgios
Lo Conte, Fabrizio
Maréchal, Sylvain
Meinen, Cédric
Melly, Thierry Bernard
Nagel, Ira
Pastre, Marc
Raboud, Didier
Sallin, Denis
Sovilla, Jérôme
Stefanucci, Camillo
Van Cutsem, Olivier Valentin Henri
Voulgari, Evgenia
Watson, Andrew
Yermolenko, Pavlo
Institute
IEM
Faculty
STI
Note
Members of ELAB (infoscience-elab)
Old institute IEL (>2021) Previous institute: IEL (>2021)
Old institute IEL (>2021) Previous institute: IEL (>2021)
Linked resource
http://elab.epfl.ch/
Publications
A 20-bit dynamic range CMOS A/D converter for ionization chambers
A current-mode back-end for a sensor microsystem
A secure and distributed message oriented middleware for smart building applications
An internally non-linear ADC for a ΣΔ accelerometer loop
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
High-speed power system stability simulation using analog computation: Systematic error analysis
Measurement and performance evaluation of a silicon on insulator pixel matrix
Modeling Minority Carriers Related Capacitive Effects for Transient Substrate Currents in Smart Power ICs
SOI digital pixel sensor based on charge pumping
Smart Power IC simulation of substrate coupled current due to majority and minority carriers transports
See complete list of publications (208)
A current-mode back-end for a sensor microsystem
A secure and distributed message oriented middleware for smart building applications
An internally non-linear ADC for a ΣΔ accelerometer loop
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
High-speed power system stability simulation using analog computation: Systematic error analysis
Measurement and performance evaluation of a silicon on insulator pixel matrix
Modeling Minority Carriers Related Capacitive Effects for Transient Substrate Currents in Smart Power ICs
SOI digital pixel sensor based on charge pumping
Smart Power IC simulation of substrate coupled current due to majority and minority carriers transports
See complete list of publications (208)
Record appears in
Authorities > Lab