Details
Title
Zhang, Chunmin
Sciper ID
245109
Affiliated labs
ICLAB
Publications
A Generalized EKV Charge-based MOSFET Model Including Oxide and Interface Traps
Amplitude analysis of the D+-> pi(-)pi(+)pi(+) decay and measurement of the pi(-)pi(+) S-wave amplitude
Bias Dependence of Total Ionizing Dose Effects on 28-nm Bulk MOSFETs
Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs
Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs
GigaRad total ionizing dose and post-irradiation effects on 28 nm bulk MOSFETs
Measurement of eta(c) (1S), eta(c)(2S), and nonresonant eta 'pi(+)pi(-) production via two-photon collisions
Measurement of the Z boson production cross-section in proton-lead collisions at root(NN)-N-s=8.16 TeV
Mobility Degradation of 28-nm Bulk MOSFETs Irradiated to Ultrahigh Total Ionizing Doses
Total Ionizing Dose Effects on Analog Performance of 28 nm Bulk MOSFETs
See complete list of publications (13)
Amplitude analysis of the D+-> pi(-)pi(+)pi(+) decay and measurement of the pi(-)pi(+) S-wave amplitude
Bias Dependence of Total Ionizing Dose Effects on 28-nm Bulk MOSFETs
Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs
Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs
GigaRad total ionizing dose and post-irradiation effects on 28 nm bulk MOSFETs
Measurement of eta(c) (1S), eta(c)(2S), and nonresonant eta 'pi(+)pi(-) production via two-photon collisions
Measurement of the Z boson production cross-section in proton-lead collisions at root(NN)-N-s=8.16 TeV
Mobility Degradation of 28-nm Bulk MOSFETs Irradiated to Ultrahigh Total Ionizing Doses
Total Ionizing Dose Effects on Analog Performance of 28 nm Bulk MOSFETs
See complete list of publications (13)
Use for
Zhang, C-M.
Zhang, Chun-Min
Zhang, Chun-Min
Link to search
All resources
Record appears in
Authorities > People